AI-Powered Semiconductor Test Analytics
From Raw STDF Data
To Instant Yield Intelligence
Upload any STDF file and get wafer maps, CPK analysis, AI insights, and natural language querying in under 60 seconds.
No signup required for sample data
CAPABILITIES
Everything a PRE engineer does.
Automated.
Wafer Map Visualization
Instantly see every die on your wafer. Spot edge failures, cluster defects, and systematic patterns that take hours to find manually.
AI Insights
Expert semiconductor analysis generated automatically. Detects swapped limits, borderline passes, and yield risks the moment you upload.
CPK Analysis
All test parameters ranked by risk automatically. Color coded so you know exactly where to focus. No manual calculation needed.
Natural Language Querying
Ask anything about your test data in plain English. Which tests have CPK below 1.33. Show me failing dies. Instant answers.
HOW IT WORKS
From file to insight in 60 seconds
Upload
Drag and drop your STDF file. Supports all major ATE manufacturers including Teradyne and Advantest.
Analyze
AI automatically generates wafer map, CPK analysis for all parameters, parametric distributions, and expert insights.
Act
Download reports, compare wafers, ask questions in plain English, and find yield root causes faster than ever.
WAFER MAP
See your wafer.
Understand your yield.
The visual your OSAT never gives you. Generated automatically from your STDF file in seconds.
The PRE engineer you cannot afford to hire.
Yieldsight gives every test engineer at every small fabless company access to expert semiconductor analytics — at a fraction of the cost of enterprise tools.
Free 30-day trial. No credit card required.