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Explore real semiconductor test analytics with sample data. See wafer maps, CPK analysis, AI insights, and more — no account needed.

Wafer Sort

Wafer Sort Analysis

DeviceTESTCHIP_A1
Dies293 dies
Yield80.9%

Shows wafer map with failure patterns

Rescreen

Rescreen Consolidation

DeviceTESTCHIP_B1
Dies149 dies
Yield93.29%

Shows data consolidation with rescreen handling

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